OUR MISSION
To provide our customers with unique RF characterization solutions by offering a combination of industry grade instrumentation products and custom measurement services.
ABOUT OPTEOS, Inc.
OPTEOS, Inc. was founded in 2002 with a focus on development and commercialization of high frequency field sensors and characterization instruments.
Electro-optic (EO) field mapping and bandgap modulation thermometry are patented technologies that were developed during 1990's at the University of Michigan under the support of the U.S. Army Research Office. Opteos has since successfully transitioned these technologies from laboratory concepts to field portable commercial products. We have also introduced magneto-optic (MO) field probes and sensors for direct measurement of magnetic fields.
EMAG Technologies Inc Acquires OPTEOS Inc.
January 2010. Ann Arbor, MI
EMAG Technologies Inc. proudly announces that it has completed the full acquisition of its spin-off company Opteos, Inc. Subsequent to this transaction, Opteos will maintain its brand name and will continue to operate and serve its customers as a wholly owned subsidiary of EMAG Technologies Inc. Opteos and EMAG will now share a consolidated pool of sate-of-the-art resources, laboratory facilities and expertise in RF engineering and microware, millimeter wave and optical technologies.
Adaptive Wideband RF Measurement Service
IEEE Microwave Magazine, December 2003
Opteos, Inc. announces the introduction of a new microwave and millimeter wave measurement service that can be used to enhance design functionality as well as conduct diagnostic testing.
As compared with port-based measurement techniques that obtain power information on a device under test using external interconnects, this new service uses a high-impedance scanning sensor to map electric field signals from the internal nodes of circuits or from the near-field radiation pattern of antennas and arrays. The measurements distinguish between amplitude and phase quantities and a have a spatial resolution down to 10 µm with a scanning area extending from square millimeters to square meters. Individual electric field polarization components of RF signals can also be discriminated by non-intrusive, non-metallic, electro-optic field sensors.
Assessment of RF devices and circuits with both guided and radiated fields is possible from UHF to W-band. Sensors are coupled via optical fiber to the measurement instrument to prevent probe interference with RF signal and to allow extraction of signals from within enclosures. Thus, this unique service offers users a local view of a circuit’s operation for a wide range of purposes, including design evaluation, analysis of failed parts, verification of RF performance, elimination of interference, and validation of models.
OUR EO/MO TECHNOLOGY
Opteos offers a range of RF field detection and scanning systems based on unique, patented, electro-optic (EO) and magneto-optic (MO) technologies. The EO probes utilize the Pockels Effect for direct meausrement of electric fields. The MO probes are used to directly measure magnetic fields based on the Faraday Effect.
Opteos's EO and MO sensing systems can be used in a growing variety of applications including characterization, diagnosis, calibration and near field scanning of RF circuits, antennas and phased arrays, test and evaluation of high power microwave systems, medical device measurements, EMC/EMI testing, etc.
USE OF OUR INSTRUMENTS AND SERVICES CAN LEAD TO A SIGNIFICANT REDUCTION IN PRODUCT DEVELOPMENT TIME AND COST.