Opteos, Inc. provides a very flexible custom measurement service that accommodates a wide range of technical needs and budgets. We use our best effort to deliver reliable and accurate test & measurement results, fast and at very low cost. The service option is ideal not only for customers who may have occasional need for such measurements, but also for those who prefer prompt evaluation of their prototypes without having to purchase or install sophisticated in-house measurement hardware.
Opteos's measurement service includes comprehensive antenna/array near field scanning, far field measurement & verification using in-house anechoic chamber, RFIC and MMIC characterization and EMC/EMI testing.
Please contact us to discuss your measurement needs and find out about the possibilities that Opteos's services can offer you. Our engineers will introduce you to a totally new experience in RF test and characterization.
